Invited Lecture in 1st IMS-FHI Symposium: “Emerging Techniques of Scanning Probe Microscopy”

I gave an invited lecture entitled "Electrode/Electrolyte Interface Analyzed by Scanning Probe Microscopy" at the 1st IMS-FHI Symposium: "Emerging Techniques of Scanning Probe Microscopy" held at the joint symposium of the Institute of Molecular Science (IMS) and Fritz Haber Institute of Germany (FHI).  We discussed future developments from lectures on research achievements related to the latest technology of scanning probe microscopy. I hope that the interaction between IMS and FHI will deepen and create new possibilities of the developments of scanning probe microscopy and also related science.

分子研(IMS)とドイツのフリッツ・ハーバー研究所(FHI)のジョイントシンポジウムで行われた1st IMS-FHI Symposium: “Emerging Techniques of Scanning Probe Microscopy”にて、“Electrode/Electrolyte Interface Analyzed by Scanning Probe Microscopy”と題した講演を行いました。走査プローブ顕微鏡の最先端技術に関わる研究成果の講演から、今後の発展について議論しました。IMSとFHIの交流が更に深まり、新しい可能性を生み出すことを期待しています。